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"A compact on-chip IR-drop measurement system in 28 nm CMOS technology."
Sebastian Dietel et al. (2014)
- Sebastian Dietel, Sebastian Höppner, Holger Eisenreich, Georg Ellguth, Stefan Hänzsche, Stephan Henker, René Schüffny, Tim Brauninger, Ulrich Fiedler:
A compact on-chip IR-drop measurement system in 28 nm CMOS technology. ISCAS 2014: 1219-1222
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