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"A modular test structure for CMOS mismatch characterization."
Massimo Conti et al. (2003)
- Massimo Conti, Paolo Crippa, Francesco Fedecostunte, Simone Orcioni, F. Ricciardi, Claudio Turchetti, Loris Vendrame:
A modular test structure for CMOS mismatch characterization. ISCAS (5) 2003: 569-572
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