"ESD protection design for wideband RF applications in 65-nm CMOS process."

Li-Wei Chu et al. (2014)

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DOI: 10.1109/ISCAS.2014.6865426

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-20

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Li-Wei Chu, Chun-Yu Lin, Ming-Dou Ker, Ming-Hsiang Song, Jeng-Chou Tseng, Chewnpu Jou, Ming-Hsien Tsai:
ESD protection design for wideband RF applications in 65-nm CMOS process. ISCAS 2014: 1480-1483

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