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"Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS ..."

Claudio Accarino et al. (2018)

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DOI: 10.1109/ISCAS.2018.8351173

access: closed

type: Conference or Workshop Paper

metadata version: 2018-10-24

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Claudio Accarino, Mohammed Al-Rawhani, Yash Diptesh Shah, Dzmitry Maneuski, Srinjoy Mitra, Craig Buttar, David R. S. Cumming:
Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology. ISCAS 2018: 1-4

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