Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Accurate On-Chip Linearity Monitoring With Low-Quality Test Signal Generation."

Matthias Wagner et al. (2023)

> Home

Details and statistics

DOI: 10.1109/ISCAS46773.2023.10181404

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-31

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iscas/0004LDGSH23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iscas/0004LDGSH23
Matthias Wagner, Oliver Lang, Simon Dorrer, Esmaeil Kavousi Ghafi, Andreas Schwarz, Mario Huemer:
Accurate On-Chip Linearity Monitoring With Low-Quality Test Signal Generation. ISCAS 2023: 1-5

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.