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"Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling."

Enrico Zanoni et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128358

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  - conf/irps/ZanoniMMRMZCGAS20
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  - https://dblp.org/rec/conf/irps/ZanoniMMRMZCGAS20
Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz:
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling. IRPS 2020: 1-10

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