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"Insights on Inter-metal Reliability Assessment of High Voltage Interconnects."

Kwang Sing Yew et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764428

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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  dblp key:
  - conf/irps/YewOYYPCT22
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  - https://dblp.org/rec/conf/irps/YewOYYPCT22
Kwang Sing Yew, Ran Xing Ong, Hin Kiong Yap, Wanbing Yi, Jacquelyn Phang, R. Chockalingam, Juan Boon Tan:
Insights on Inter-metal Reliability Assessment of High Voltage Interconnects. IRPS 2022: 49-1

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