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"A Reliable Triple-Level Operation of Resistive-Gate Flash Featuring ..."

W. Y. Yang et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405179

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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  dblp key:
  - conf/irps/YangHCCLC21
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W. Y. Yang, E. R. Hsieh, C. H. Cheng, B. Y. Chen, K. S. Li, Steve S. Chung:
A Reliable Triple-Level Operation of Resistive-Gate Flash Featuring Forming-Free and High Immunity to Sneak Path. IRPS 2021: 1-6

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