"Breakdown Lifetime Analysis of HfO2-based Ferroelectric Tunnel Junction ..."

Marina Yamaguchi et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129314

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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Marina Yamaguchi, Shosuke Fujii, Kensuke Ota, Masumi Saitoh:
Breakdown Lifetime Analysis of HfO2-based Ferroelectric Tunnel Junction (FTJ) Memory for In-Memory Reinforcement Learning. IRPS 2020: 1-6

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