"Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm ..."

Wei Chun Wang et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529313

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Wei Chun Wang, Shida Zhang, Sudarshan Sharma, Minah Lee, Saibal Mukhopadhyay:
Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS. IRPS 2024: 1-4

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