"Reliability of InGaZnO Transparent ReRAM with Optically Active Pt-Nanodisks."

Kavita Vishwakarma et al. (2023)

Details and statistics

DOI: 10.1109/IRPS48203.2023.10118092

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-12

a service of  Schloss Dagstuhl - Leibniz Center for Informatics