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"A Unified Framework to Explain Random Telegraph Noise Complexity in ..."

Sara Vecchi, Paolo Pavan, Francesco Maria Puglisi (2023)

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DOI: 10.1109/IRPS48203.2023.10117832

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Sara Vecchi, Paolo Pavan, Francesco Maria Puglisi:
A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs. IRPS 2023: 1-6

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