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"Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM."

Taiki Uemura et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117908

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/UemuraCCLHP23
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  - https://dblp.org/rec/conf/irps/UemuraCCLHP23
Taiki Uemura, Byungjin Chung, Shin-Young Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae:
Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM. IRPS 2023: 1-8

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