"Robustness to Device Degradation in Silicon FeFET-based Reservoir ..."

Kasidit Toprasertpong et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529344

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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Kasidit Toprasertpong, Eishin Nako, Shin-Yi Min, Zuocheng Cai, Seong-Kun Cho, Rikuo Suzuki, Ryosho Nakane, Mitsuru Takenaka, Shinichi Takagi:
Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited). IRPS 2024: 1-6

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