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"Silicon based degradation model for various types of highly integrated MOL ..."

A. Thiessen, M. Haack, Markus Herklotz (2023)

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DOI: 10.1109/IRPS48203.2023.10118209

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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A. Thiessen, M. Haack, Markus Herklotz:
Silicon based degradation model for various types of highly integrated MOL resistor devices. IRPS 2023: 1-5

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