"Modeling BTI Reliability in CMOS DRAM Periphery Device: A Review of BTI ..."

A. Subirats et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983189

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

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A. Subirats, M. Samiee, G. Ferrari, U. Sharma, T. Imamoto, M. Yokomichi, S. Srivastava, K. Florent, T. Owens, A. S. Bisht, S. Mahapatra:
Modeling BTI Reliability in CMOS DRAM Periphery Device: A Review of BTI Analysis Tool (BAT). IRPS 2025: 1-6

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