"Transistor reliability characterization and modeling of the 22FFL FinFET ..."

Chen-Yi Su et al. (2018)

> Home

Details and statistics

DOI: 10.1109/IRPS.2018.8353652

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-31

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/SuAJKLLMPPPSSSW18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/SuAJKLLMPPPSSSW18
Chen-Yi Su, M. Armstrong, Lei Jiang, S. A. Kumar, C. D. Landon, S. Liu, Inanc Meric, K. W. Park, Leif Paulson, K. Phoa, Bernhard Sell, Jihan Standfest, Ketul B. Sutaria, J. Wan, D. Young, Stephen Ramey:
Transistor reliability characterization and modeling of the 22FFL FinFET technology. IRPS 2018: 6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.