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"Assessing SiCr resistor drift for automotive analog ICs."

Kevin A. Stewart et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405169

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-20

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  dblp key:
  - conf/irps/StewartKRNHJHGP21
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  - https://dblp.org/rec/conf/irps/StewartKRNHJHGP21
Kevin A. Stewart, Keiichi Kimura, Matt Ring, Koen Noldus, Pat Hulse, Rick C. Jerome, Akihiro Hasegawa, Jeff P. Gambino, David T. Price:
Assessing SiCr resistor drift for automotive analog ICs. IRPS 2021: 1-4

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