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"RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications."

P. Srinivasan et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405220

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-24

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  dblp key:
  - conf/irps/SrinivasanGSJLJ21
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  - https://dblp.org/rec/conf/irps/SrinivasanGSJLJ21
P. Srinivasan, Fernando Guarin, Shafi Syed, Joris Angelo Sundaram Jerome, Wen Liu, Sameer H. Jain, Dimitri Lederer, Stephen Moss, Paul Colestock, Anirban Bandyopadhyay, Ned Cahoon, Byoung Min, Martin Gall:
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. IRPS 2021: 1-6

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