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"Thermal Considerations on RF Reliability and Aging in SOI CMOS Based Power ..."

P. Srinivasan et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529385

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  dblp key:
  - conf/irps/SrinivasanGRLSTBGL24
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  - https://dblp.org/rec/conf/irps/SrinivasanGRLSTBGL24
P. Srinivasan, Oscar H. Gonzalez, Oscar D. Restrepo, J. Lestage, Shafi Syed, W. Taylor, Anirban Bandyopadhyay, Martin Gall, S. Ludvik:
Thermal Considerations on RF Reliability and Aging in SOI CMOS Based Power Amplifiers. IRPS 2024: 1-6

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