"Fast Neutron Irradiation Effects on Multiple Gallium Nitride (GaN) Device ..."

Luis Soriano et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129517

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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Luis Soriano, Hector Valencia, Ke-Xun Sun, Ronald Nelson:
Fast Neutron Irradiation Effects on Multiple Gallium Nitride (GaN) Device Reliability in Presence of Ambient Variations. IRPS 2020: 1-6

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