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"Cross-coupled Self-Heating and Consequent Reliability Issues in GaN-Si ..."

Sruthi M. P et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118187

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/PMNCDDA23
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Sruthi M. P, Md. Asaduz Zaman Mamun, Deleep R. Nair, Anjan Chakravorty, Nandita DasGupta, Amitava DasGupta, Muhammad Ashraful Alam:
Cross-coupled Self-Heating and Consequent Reliability Issues in GaN-Si Hetero-integration: Thermal Keep-Out-Zone Quantified. IRPS 2023: 1-6

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