Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI ..."

Alan Y. Otero-Carrascal et al. (2024)

> Home

Details and statistics

DOI: 10.1109/IRPS48228.2024.10529489

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/OteroCarrascalCGTHS24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/OteroCarrascalCGTHS24
Alan Y. Otero-Carrascal, Dora A. Chaparro-Ortiz, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Gonzalez, P. Srinivasan:
Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique. IRPS 2024: 53

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.