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"An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced ..."

Sangmin Oh et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529338

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  - conf/irps/OhJYLKJJSCJ24
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Sangmin Oh, Taeyoung Jeong, Junghwan Yum, Minhyuk Lim, Yoohwan Kim, Bongyong Jeong, Jeongmin Jo, Hyewon Shim, Shin-Young Chung, Paul Jung:
An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology. IRPS 2024: 1-5

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