Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"The Impact of Scaling on the Effects of Mixed-Mode Electrical Stress and ..."

Delgermaa Nergui et al. (2024)

> Home

Details and statistics

DOI: 10.1109/IRPS48228.2024.10529309

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/NerguiHMLSLZFC24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/NerguiHMLSLZFC24
Delgermaa Nergui, M. Hosseinzadeh, Y. A. Mensah, Harrison P. Lee, D. G. Sam, K. Li, E. X. Zhang, Daniel M. Fleetwood, John D. Cressler:
The Impact of Scaling on the Effects of Mixed-Mode Electrical Stress and Ionizing Radiation for 130-nm and 90-nm SiGe HBTs. IRPS 2024: 1-5

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.