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"A Unified Aging Model Framework Capturing Device to Circuit Degradation ..."

S. Mukhopadhyay et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117914

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-27

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  dblp key:
  - conf/irps/MukhopadhyayCJSMGR23
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  - https://dblp.org/rec/conf/irps/MukhopadhyayCJSMGR23
S. Mukhopadhyay, C. Chen, M. Jamil, Jihan Standfest, Inanc Meric, Balkaran Gill, Stephen Ramey:
A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes. IRPS 2023: 1-4

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