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"Effect of Source & Drain Side Abutting on the Low Current ..."

M. Monishmurali et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764606

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava:
Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices. IRPS 2022: 6

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