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"Analysis of charge-to-hot-carrier degradation in Ge pFinFETs."

Wataru Mizubayashi et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129279

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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  dblp key:
  - conf/irps/MizubayashiOFIE20
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  - https://dblp.org/rec/conf/irps/MizubayashiOFIE20
Wataru Mizubayashi, Hiroshi Oka, Koichi Fukuda, Yuki Ishikawa, Kazuhiko Endo:
Analysis of charge-to-hot-carrier degradation in Ge pFinFETs. IRPS 2020: 1-4

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