Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Plasma processing induced charging damage (PID) assessment with ..."

Andreas Martin (2022)

> Home

Details and statistics

DOI: 10.1109/IRPS48227.2022.9764556

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/Martin22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/Martin22
Andreas Martin:
Plasma processing induced charging damage (PID) assessment with appropriate fWLR stress methods ensuring expected MOS reliability and lifetimes for automotive products (Invited). IRPS 2022: 5

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.