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"A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for ..."

Bikram Kishore Mahajan et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764435

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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  dblp key:
  - conf/irps/MahajanCAVKR22
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Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy:
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors. IRPS 2022: 10

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