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"HV-CV Analysis Trapping Behavior in 650V pGaN HEMT with Field Plates for ..."

Y. S. Lin et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529485

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  - conf/irps/LinYWSYSHCCCHCK24
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Y. S. Lin, Cheng Hsun Yang, C. H. Wang, K. P. Sou, Cheng Hong Yang, M. C. Shih, W. S. Hung, W. H. Chuang, F. M. Ciou, P. C. Chiu, C. C. Hsu, C. F. Chen, D. M. Kuo:
HV-CV Analysis Trapping Behavior in 650V pGaN HEMT with Field Plates for High-Voltage Power Applications. IRPS 2024: 2

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