"Chip-level characterization and RTN-induced error mitigation beyond 20nm ..."

T. W. Lin et al. (2018)

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DOI: 10.1109/IRPS.2018.8353679

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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T. W. Lin, S. H. Ku, C. H. Cheng, C. W. Lee, Ijen Huang, Wen-Jer Tsai, T. C. Lu, W. P. Lu, K. C. Chen, Tahui Wang, Chih-Yuan Lu:
Chip-level characterization and RTN-induced error mitigation beyond 20nm floating gate flash memory. IRPS 2018: 6-1

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