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"Applying Universal Chip Telemetry to Detect Latent Defects and Aging in ..."

Evelyn Landman et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764449

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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  dblp key:
  - conf/irps/LandmanBSH22
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Evelyn Landman, Alex Burlak, C. Nir Sever, Marc Hutner:
Applying Universal Chip Telemetry to Detect Latent Defects and Aging in Advanced Electronics. IRPS 2022: 38-1

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