"A Valid Experimental Design of the Lifetime Prediction for NAND Cell Oxide."

Hyuk Je Kwo et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529448

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-08

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Hyuk Je Kwo, Hyung Suk Yu, Bongman Choi, Jinseon Yeom, Hyungsuk Kim, Tae-Min Park, Jaeyong Jeong, Eun-Kyoung Kim:
A Valid Experimental Design of the Lifetime Prediction for NAND Cell Oxide. IRPS 2024: 1-6

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