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"Novel methodology for temperature-aware electromigration assessment in ..."

Armen Kteyan et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764415

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/KteyanSYK22
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Armen Kteyan, Valeriy Sukharev, Y. Yi, Chris H. Kim:
Novel methodology for temperature-aware electromigration assessment in on-chip power grid: simulations and experimental validation (Invited). IRPS 2022: 8

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