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"Effects of UBM Thickness and Current Flow Configuration on ..."
Yi Ram Kim et al. (2020)
- Yi Ram Kim, Allison T. Osmanson, Hossein Madanipour, Choong-Un Kim, Patrick F. Thompson, Qiao Chen:
Effects of UBM Thickness and Current Flow Configuration on Electromigration Failure Mechanisms in Solder Interconnects. IRPS 2020: 1-5
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