"Comprehensive Study of Saturation Current Impact on LDMOS Reliability."

F. Y. Jin et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983636

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

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F. Y. Jin, C. H. Yang, M. C. Shih, P. L. Wang, W. S. Hung, W. H. Chuang:
Comprehensive Study of Saturation Current Impact on LDMOS Reliability. IRPS 2025: 1-6

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