BibTeX record conf/irps/JiGLJUKSLPJHLLH20

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  author    = {Yongsung Ji and
               Hyunjae Goo and
               Jungman Lim and
               Tae{-}Young Jeong and
               Taiki Uemura and
               Gun Rae Kim and
               Boil Seo and
               Seungbae Lee and
               Goeun Park and
               Jeongmin Jo and
               Sang Il Han and
               Kilho Lee and
               Junghyuk Lee and
               Sohee Hwang and
               Daesop Lee and
               Suksoo Pyo and
               Hyun Taek Jung and
               Shinhee Han and
               Seungmo Noh and
               Kiseok Suh and
               Sungyoung Yoon and
               Hyeonwoo Nam and
               Hyewon Hwang and
               Hai Jiang and
               J. W. Kim and
               D. Kwon and
               Yoonjong Song and
               K. H. Koh and
               Hwasung Rhee and
               Sangwoo Pae and
               E. Lee},
  title     = {Reliability of Industrial grade Embedded-STT-MRAM},
  booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
               Dallas, TX, USA, April 28 - May 30, 2020},
  pages     = {1--3},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {},
  doi       = {10.1109/IRPS45951.2020.9129178},
  timestamp = {Thu, 21 Jan 2021 08:53:38 +0100},
  biburl    = {},
  bibsource = {dblp computer science bibliography,}
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