"Reliability Analysis by Charge Migration of 3D SONOS Flash Memory."

Jun-Kyo Jeong et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128344

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-18

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Jun-Kyo Jeong, Jae-Young Sung, Hee-Hun Yang, Hi-Deok Lee, Ga-Won Lee:
Reliability Analysis by Charge Migration of 3D SONOS Flash Memory. IRPS 2020: 1-5

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