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"A novel GaN HEMT degradation mechanism observed during HTST test."

Ferdinando Iucolano et al. (2018)

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DOI: 10.1109/IRPS.2018.8353707

access: closed

type: Conference or Workshop Paper

metadata version: 2019-04-08

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  dblp key:
  - conf/irps/IucolanoPRC18
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  - https://dblp.org/rec/conf/irps/IucolanoPRC18
Ferdinando Iucolano, Antonino Maurizio Parisi, Santo Reina, Alessandro Chini:
A novel GaN HEMT degradation mechanism observed during HTST test. IRPS 2018: 4-1

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