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"Lifetime evaluation for Hybrid-Drain-embedded Gate Injection Transistor ..."

Ayanori Ikoshi et al. (2018)

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DOI: 10.1109/IRPS.2018.8353594

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  - conf/irps/IkoshiTYAHSYUTU18
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  - https://dblp.org/rec/conf/irps/IkoshiTYAHSYUTU18
Ayanori Ikoshi, Masahiro Toki, Hiroto Yamagiwa, Daijiro Arisawa, Masahiro Hikita, Kazuki Suzuki, Manabu Yanagihara, Yasuhiro Uemoto, Kenichiro Tanaka, Tetsuzo Ueda:
Lifetime evaluation for Hybrid-Drain-embedded Gate Injection Transistor (HD-GIT) under practical switching operations. IRPS 2018: 4

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