"Enhancing Reliability of Power IC and Power Devices for AI Hardware: ..."

Jifa Hao, Haitham Hamed (2025)

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DOI: 10.1109/IRPS48204.2025.10983091

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type: Conference or Workshop Paper

metadata version: 2025-06-04

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Jifa Hao, Haitham Hamed:
Enhancing Reliability of Power IC and Power Devices for AI Hardware: Addressing Gate Oxide Defects, Transient Voltage Overshoot, and BVDss Instability. IRPS 2025: 1-6

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