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"Suppression of endurance-stressed data-retention failures of 40nm ..."
Shouhei Fukuyama et al. (2018)
- Shouhei Fukuyama, Kazuki Maeda, Shinpei Matsuda, Ken Takeuchi, Ryutaro Yasuhara:
Suppression of endurance-stressed data-retention failures of 40nm TaOx-based ReRAM. IRPS 2018: 4-1
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