"Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress."

Yaru Ding et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764559

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-19

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Yaru Ding, Wei Liu, Yiming Qu, Liang Zhao, Yi Zhao:
Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress. IRPS 2022: 50-1

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