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"Analysis of 28 nm SRAM cell stability under mechanical load applied by ..."

André Clausner et al. (2018)

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DOI: 10.1109/IRPS.2018.8353607

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-06

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  - conf/irps/ClausnerSKOPGWL18
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  - https://dblp.org/rec/conf/irps/ClausnerSKOPGWL18
André Clausner, Simon Schlipf, Gottfried Kurz, Michael Otto, Jens Paul, Kay-Uwe Giering, Jens Warmuth, André Lange, Roland Jancke, Andreas Aal, Rüdiger Rosenkranz, Martin Gall, Ehrenfried Zschech:
Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation. IRPS 2018: 5

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