Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN ..."

Marcello Cioni, Nicolò Zagni, Alessandro Chini (2022)

> Home

Details and statistics

DOI: 10.1109/IRPS48227.2022.9764502

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/CioniZC22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/CioniZC22
Marcello Cioni, Nicolò Zagni, Alessandro Chini:
Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications. IRPS 2022: 11

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.