"A Critical Investigation of Hot Carrier Degradation in Low VTNMOSFETs in DRAM."

N. Choudhury et al. (2025)

> Home

Details and statistics

DOI: 10.1109/IRPS48204.2025.10983312

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/ChoudhuryLSYKLH25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/ChoudhuryLSYKLH25
N. Choudhury, S. Lee, D. Son, G. Yang, G.-J. Kim, N.-H. Lee, Y. C. Hwang, SB. Ko, S. Pae:
A Critical Investigation of Hot Carrier Degradation in Low VTNMOSFETs in DRAM. IRPS 2025: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.