"A Comprehensive Hot Carrier Injection with Voltage Ramp Stress (HCI-VRS) ..."

C. H. Chiang et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529412

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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C. H. Chiang, K. P. Sou, D. S. Huang, J. H. Lee:
A Comprehensive Hot Carrier Injection with Voltage Ramp Stress (HCI-VRS) through Different Model Verification for More than Moore Diversity Application. IRPS 2024: 1-4

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