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"V-Ramp test and gate oxide screening under the "lucky" defect model."

Kin P. Cheung (2023)

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DOI: 10.1109/IRPS48203.2023.10118184

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/Cheung23
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Kin P. Cheung:
V-Ramp test and gate oxide screening under the "lucky" defect model. IRPS 2023: 1-4

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