"Comparative Study on the Energy Distribution of Defects under HCD and NBTI ..."

Hao Chang et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405162

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-05

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Hao Chang, Longda Zhou, Hong Yang, Zhigang Ji, Qianqian Liu, Eddy Simoen, Huaxiang Yin, Wenwu Wang:
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs. IRPS 2021: 1-5

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